Biography:

Dr. Javier Santillan has more than 10 years experience applying X-ray technologies to the analysis of materials. He received his B.S. in Geological Sciences from the University of California, Santa Barbara in 1999. He earned a Ph.D. from the University of California, Santa Cruz in 2004. His doctoral work focused on the crystal structures and molecular vibration characteristics of carbonate materials at ultra-high pressures and temperatures. Through his dissertation research he gained a broad based background in the study of materials using synchrotron X-ray radiation at the Stanford Synchrotron Radiation Laboratory, the Advanced Light Source and the Advanced Photon Source. Dr. Santillan’s postdoctoral research was conducted as a Ford Foundation Fellow in Geophysics at the Massachusetts Institute of Technology with a focus on Raman spectroscopy and synchrotron X-ray diffraction. Following the completion of his academic studies, he joined Wilmington, MA based Ahura Scientific in 2006 with a specialization in the identification of explosives and illicit drugs using laser spectroscopy. While working at Ahura he organized a large-scale training program in chemical identification for both military and civilian organizations. In 2008 Dr. Santillan accepted a position with General Electric as leader of the Phoenix X-ray Computed Tomography applications laboratory now located in San Carlos, CA. The lab focuses on both service and sales applications across in a variety of disciplines including microelectronics, geological materials and biological samples.

Biography:

Dr. Wenbing Yun founded Xradia Inc., a leading supplier of high resolution x-ray imaging instruments in 2000. Dr. Yun led the efforts responsible for obtaining funding for the research and technology as well as transitioning the company to professional management. Dr. Yun has published more than 100 scientific papers, holds more than 35 patents and was the recipient of 2 R&D 100 awards for developing x-ray imaging systems. Dr. Yun currently serves as the Chief Technology Officer for Xradia Inc.

Biography:

Dr. Vanderlinde received his Ph.D. in Materials Science and Engineering from Cornell University and holds MS degrees in Electrical Engineering and Technical Management from Johns Hopkins University. Dr. Vanderlinde served as the team leader for nanotechnology at the Laboratory for Physical Sciences and is currently the Safe and Secure Operations Program Manager for the Intelligence Advanced Research Projects Activity (IARPA).

Biography:

Dr. Jeffery L. Yarger is a professor of Chemistry, Biochemistry and Physics and is the founding Director of the Magnetic Resonance Research Center at Arizona State University. His research group is focused on theoretical development, technique development, fundamental elucidation, and applied uses of amorphous materials. Dr. Yarger received his B.S. from the University of Arizona in 1992. He then spent a year at DuPont Inc. developing fluoropolymer characterization techniques, primarily focused on magnetic resonance. He attended Arizona State University for graduate studies in Chemistry and Physics, receiving his Ph.D. in 1996. His dissertation research was on the fundamental theory and experimental characterization of amorphous-amorphous phase transitions, coined ‘polyamorphism’. From 1996-1998, Dr. Yarger spent two years at the University of California at Berkeley and Lawrence Berkeley National Laboratory working as a National Science Foundation (NSF) sponsored postdoctoral fellow in the group of Prof. Alex Pines developing nuclear magnetic resonance (NMR) and magnetic resonance imaging (MRI) techniques for elucidating and imaging materials. Dr. Yarger was a professor of Chemistry at the University of Wyoming and an adjunct professor of Physics at Colorado State University from 1998-2005, were he started his research group in amorphous materials. He then moved to ASU in 2005, where he is currently a professor of Chemistry, Biochemistry and Physics and runs a multi-disciplinary group in the development and characterization of advanced amorphous materials and biological polymers.

Biography:

Dr. Subramaniam received his Ph.D. in Physical Chemistry from Stanford University and completed postdoctoral training in the Departments of Chemistry and Biology at M.I.T. He is chief of the Biophysics Section in the Laboratory of Cell Biology at the Center for Cancer Research, National Cancer Institute. Dr. Subramaniam has received many honors including the Damon-Runyon Walter-Winchell Cancer Research Foundation Fellowship award, Fogarty Senior International Fellowship award, NIH Director’s Award, the Searle Scholar Award, FLC MAR Excellence in Technology Transfer Award, election to membership in the American Academy of Microbiology, and has served on the Advisory Boards for the Center for Cancer Research, NCI, the NIH graduate partnerships program, and the Advanced Technology Program at SAIC-Frederick. He holds a visiting faculty appointment at the Johns Hopkins University School of Medicine, and has authored over 85 publications. His current work is focused on the development and application of advanced technologies for imaging viruses and cells at molecular resolution using 3D electron microscopy to address fundamental problems in AIDS and cancer research.

Biography:

Gary F. Shade is a member of Senior Staff at Insight Analytical Labs and has worked in the semiconductor industry for 30 years starting in semiconductor fabrication followed by a variety of work in Failure Analysis at fortune 100 companies including Intel, Ford Microelectronics, and Westinghouse. In this time, he has experienced a wide range of materials, technologies, and manufacturing methods each with its own unique FA solutions. Since joining Insight Analytical labs, this pattern has continued with work on GaAs, Silicon, Optoelectronics, PCBs and MEMS for industries as diverse as commercial, aerospace/military, automotive, medical and communications. For the past two years, his interests have capitalized on this experience to analyze counterfeit electronics. To date, over 250 devices have been analyzed. Gary is actively involved in the industry via publications on Failure Analysis techniques, tutorials on Photoemission and MEMS and active service to ISTFA and EDFAS. He has a Masters in Semiconductor Physics from Washington University in St. Louis and a B.A in Physics from William Jewell College.

Biography:

Diganta Das (Ph.D., Mechanical Engineering, University of Maryland, College Park, B. Tech. (Hons), Manufacturing Science and Engineering, Indian Institute of Technology) is a member of the research staff at the Center for Advanced Life Cycle Engineering (CALCE). His expertise is in reliability, environmental and operational ratings of electronic parts, uprating, electronic part reprocessing, technology trends in the electronic parts and parts selection and management methodologies. Dr. Das has published more than 50 articles on these subjects. He had been the technical editor for two IEEE standards and is currently vice chairman of IEEE Reliability Society Standards Working Group. He is an editorial board member for the journal Microelectronics Reliability and Circuit World. He is a Six Sigma Black Belt and a member of IEEE and IMAPS.