Summary / Mission
To serve the interests of failure analysis & materials characterization professionals by providing a forum for the presentation and active discussion of timely and pertinent technological issues and trends and to promote the development of new capabilities that fill critical gaps in emerging technologies.
*Unlike traditional conferences that often restrict audience participation, AMFA Workshops provide only top quality invited speakers on leading edge topics, in a format where audience participation is expected and strongly encouraged.
For a printable summary click here.
Workshop Presentations
8:30Metrology for Emerging Device and MaterialsEric Vogel, University of Texas, Dallas
9:30Leveraging Federal Funding for ToolsBruce Gnade, University of Texas, Dallas
10:30Break
11:00Materials Characterization Using Ultrafast LasersDavid Cahill, University of Illinois
12:00Lunch
1:00Failure Analysis Year in ReviewChristian Boit, Berlin University of Technology
2:00Atomic Level Ion Source Microscopy Bill Thompson, ALIS Corp
3:00Break
3:30“FA Role: Dynamic Driver or Passive Passenger?”Rich Blish, Spansion, Efrat Raz, Gatan
4:30Breakout and Wrap-upRich Blish, Spansion, Efrat Raz, Gatan
Sponsors
The AMFA Workshop is technically co-sponsored by:
IEEE Reliability Society
Electronic Device Failure Analysis Society