AMFA workshops provide only top quality invited speakers on leading edge topics, in a format where audience participation is expected and strongly encouraged. The AMFA workshop has a mixture of academic, industry and vendor presentations. It is not a sales show, nor is it an academic or theoretical conference. It is a broad, material and failure analysis forum where attendees come to learn about and exchange ideas on recent developments in the semiconductor and nanomaterial characterization industry. Everyone is looking to obtain or supply real solutions to present and future problems.
To serve the interests of failure analysis and materials characterization professionals by providing a forum for the presentation and active discussion of timely and pertinent technological issues and trends and to promote the development of new capabilities that fill critical gaps in emerging technologies.
Vallett, D. P. (2007).
"Why Waste Time on Roadmaps When We Don't Have Cars?"
Device and Materials Reliability, IEEE Transactions on 7(1): 5-10.
Pathangey, B., A. Proctor, et al. (2007).
"Application of TOFSIMS for Contamination Issues in the Assembly World."
Device and Materials Reliability, IEEE Transactions on 7(1): 11-18.
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