Welcome to the Advanced Failure and Materials Analysis Workshop
Mark your calendars now to attend the 6th annual Advanced Materials Failure Analysis (AMFA) Workshop on August 4, 2013 at the Indiana Convention Center, located in Indianapolis, Indiana. This year's AMFA Workshop will be co-located with Microscopy and Microanalysis 2013 (M&M 2013). Attendees can go to both events easily with a single trip. Early bird registration for the 6th annual AMFA workshop will be open soon at the M&M site, so please return to the site soon. This year's AMFA program consists of presentations covering emerging topics in the fields of microelectronics and biotechnology. Presentations include a look into imaging techniques to map the mouse brain, entomology of anthrax through x-ray and TEM imaging, 3-D tomography with light and electron microscopy, characterizing virus-like nanoparticles, FTIR detection of cancer cells, applied nanobioscience and medicine, and bringing Moore's Law to the biology world. Our goal is to create a forum that fosters open communication between the two communities to identify common issues found in each community's technology and capabilities roadmap. The unique capabilities of one community may have surprising results for the other.